@article{3,
abstract = {We propagate for the first time correlated measurement uncertainties into a nonlinear behavioral model of a millimeter-wave amplifier. We make use of the National Institute of Standards and Technology Microwave Uncertainty Frameworkto evaluate the uncertainties in large-signal electromagnetic wave measurements of an amplifier, followed by the extraction of X-parameters using an industry standard algorithm. This extracted model is included as a component in a circuit simulator to evaluate gain and efficiency incorporating measurement uncertainty.},
author = {L.T. Stant and M.J. Salter and N.M. Ridler and D.F. Williams and P.H. Aaen},
journal = {IEEE Trans. Microw. Theory Techn.},
month = {November},
title = {Propagating Measurement Uncertainty to Microwave Amplifier Nonlinear Behavioral Models},
year = {2018}
}
We propagate for the first time correlated measurement uncertainties into a nonlinear behavioral model of a millimeter-wave amplifier. We make use of the National Institute of Standards and Technology Microwave Uncertainty Frameworkto evaluate the uncertainties in large-signal electromagnetic wave measurements of an amplifier, followed by the extraction of X-parameters using an industry standard algorithm. This extracted model is included as a component in a circuit simulator to evaluate gain and efficiency incorporating measurement uncertainty.
