@inproceedings{1,
abstract = {This paper presents a microwave impedance characterization technique for extreme impedance devices. The method is based on active interferometry and uses a 2-source 4-port vector network analyzer, which allows for a compact and straight-forward implementation. A new calibration algorithm is described that incorporates error terms from two separate three-known-load calibrations. Based on simulated and measured data, the proposed technique shows substantial improvement in obtaining the impedance of two offset-short devices when compared with conventional measurements.},
address = {San Antonio, TX, USA},
author = {H. Votsi and L.T. Stant and C. Matei and M.J. Salter and C. Li and N.M. Ridler and P.H. Aaen},
booktitle = {94th Automatic Radio Frequency Techniques Group (ARFTG) Microwave Measurement Symposium},
journal = {IEEE Trans. Instrum. Meas.},
month = {January},
title = {An Interferometric Characterisation Technique for Extreme Impedance Microwave Devices},
year = {2020}
}